Search results for "Analyse de défaillances"
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Multimodal and multicriteria analysis for VLSI expertises and defects localization
2017
The purpose of this manuscript is to exhibit the research work solving the issue of data processing stem from defect localization techniques. This step being decisive in the failure analysis process, scientists have to harness data coming from light emission and laser techniques. Nevertheless, this analysis process is sequential and only depends on the expert’s decision. This factor leads to a not quantified probability of localization. Consequently to solve these issues, a multimodal and multicriteria analysis has been developped, taking advantage of the heterogeneous andcomplementary nature of light emission and laser probing techniques. This kind of process is based on advanced level too…